Chemistry for electron-induced nanofabrication

• Petra Swiderek,
• Hubertus Marbach and
• Cornelis W. Hagen

Beilstein J. Nanotechnol. 2018, 9, 1317–1320, doi:10.3762/bjnano.9.124

• precursor, thus highlighting the importance of the actual chemical nature of the substrate [31]. This Thematic Series is completed by publications on interesting applications of FEBID. This concerns the fabrication and characterization of magnetic cobalt nanospheres on cantilever tips for magnetic resonance

• force microscopy [32] as well as nanostructures fabricated by a combination of FEBID and autocatalytic growth processes and used as templates for the growth of carbon nanotubes [33]. In summary, the publications collected in the Thematic Series at hand document significant progress in the understanding

Magnetic properties of optimized cobalt nanospheres grown by focused electron beam induced deposition (FEBID) on cantilever tips

• Soraya Sangiao,
• César Magén,
• Darius Mofakhami,
• Grégoire de Loubens and
• José María De Teresa

Beilstein J. Nanotechnol. 2017, 8, 2106–2115, doi:10.3762/bjnano.8.210

• work, we present a detailed investigation of the magnetic properties of cobalt nanospheres grown on cantilever tips by focused electron beam induced deposition (FEBID). The cantilevers are extremely soft and the cobalt nanospheres are optimized for magnetic resonance force microscopy (MRFM) experiments

• . Keywords: cobalt nanostructures; electron holography; focused electron beam induced deposition; magnetic deposits; magnetic resonance force microscopy; Introduction Through the local decomposition of magnetic precursor molecules by the action of an incoming electron beam, a wide range of functional

• of tip cantilevers with applications in magnetic force microscopy (MFM) [7][8][9][10] and magnetic resonance force microscopy (MRFM) [11]; (c) planar nanowires for application in magnetic domain-wall conduits [12][13], in logic circuits [14][15], in dense memory arrays [16] and for superconducting

Scanning probe microscopy and related methods

• Ernst Meyer

Beilstein J. Nanotechnol. 2010, 1, 155–157, doi:10.3762/bjnano.1.18

• Microscopy, FMM: Force Modulation Microscopy, ic-AFM: intermittent contact AFM, TMAFM: tapping mode AFM, nc-AFM: non-contact AFM, KPFM: Kelvin probe force microscopy, EFM: Electrostatic force microscopy, MFM: Magnetic force microscopy, MRFM: Magnetic resonance force microscopy, NSOM: Near-field scanning